Semi-automatic test system for characterization of ASIC/MPWS

Authors

  • Jerzy Zając
  • Janusz Wójcik

DOI:

https://doi.org/10.26636/jtit.2005.1.280

Keywords:

automatic testing, diagnostics of technology, multiproject wafers

Abstract

A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.

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Published

2005-03-30

Issue

No. 1 (2005)

Section

ARTICLES FROM THIS ISSUE

License

Copyright (c) 2005 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
J. Zając and J. Wójcik, “Semi-automatic test system for characterization of ASIC/MPWS”, JTIT, vol. 19, no. 1, pp. 124–128, Mar. 2005, doi: 10.26636/jtit.2005.1.280.