Semi-automatic test system for characterization of ASIC/MPWS
DOI:
https://doi.org/10.26636/jtit.2005.1.280Keywords:
automatic testing, diagnostics of technology, multiproject wafersAbstract
A measurement system for integrated circuit testing has been developed. It consists of a semi-automatic probe station and a set of measurement equipment controlled by commercially available measurement software. The probe station is controlled by dedicated software. Both the measurement and station-control software communicate using the DDE protocol. The measurement system is flexible. It is particularly suitable for semi-automatic testing of multi-project wafers. Output data generated by the system is used for the characterization of the CMOS technologies.
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Copyright (c) 2005 Journal of Telecommunications and Information Technology
This work is licensed under a Creative Commons Attribution 4.0 International License.
