A method for evaluation of uncertainties of noise parameter measurement

Authors

DOI:

https://doi.org/10.26636/jtit.2002.1.97

Keywords:

microwaves, noise metrology, measurement system, four noise parameters, sensitivity analysis, error propagation, uncertainty

Abstract

The assessment of uncertainties of a two-port noise parameters measurement, presented in the paper, relies on modeling of sources of errors and an investigation of propagation of the errors through a measurement system. This approach is based on a simplified additive error model and small-change sensitivity analysis. The evaluated uncertainties agrees with those observed in experiments. This method may be implemented in automatic noise measurement systems for on-line uncertainty assessment and for optimization of the design of an experiment.

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References

[1] J. W. Archer and R. A. Batchelor, "Fully automated on-wafer noise characterization of GaAs MESFET's and HEMT's", IEEE Trans. Microw. Theory Techn., vol. 40, no. 2, pp. 209-216, 1992.
View in Google Scholar

[2] R. Benelbar, B. Huyart, and R. G. Bosisio, "Microwave noise characterization of two-port devices using an uncalibrated tuner", IEEE Trans. Microw. Theory Techn., vol. 44, no. 10, pp. 1725-1728, 1996.
View in Google Scholar

[3] S. Van den Bosch and L. Martens, "Improved impedance-pattern generation for automatic noise-parameter determination", IEEE Trans. Microw. Theory Techn., vol. 46, no. 11, pp. 1673-1678, 1998.
View in Google Scholar

[4] A. C. Davidson, B. W. Leake, and E. W. Strid, "Accuracy improvements in microwave measurement of noise parameters", IEEE Trans. Microw. Theory Techn., vol. MTT-37, pp. 1973-1977, 1989.
View in Google Scholar

[5] G. Mamola and M. Sannino, "Errors in measurement of microwave transistor noise parameters", Alta Freq., vol. XLII, no. 10, pp. 551-556, 1973.
View in Google Scholar

[6] M. Schmidt-Szałowski, "Experimental verification of measurement uncertainties of multi-state radiometer system", in Conf. MIKON'96, Warsaw, Poland, 1996, pp. 331-335.
View in Google Scholar

[7] M. Schmidt-Szałowski and W. Wiatr, "An improved method for simultaneous small-signal and noise characterization of two-ports using multi-state radiometer", in Conf. EuMC'99, Muenchen, Germany, 1999, pp. 61-64.
View in Google Scholar

[8] B. N. Taylor and C. E. Kuyatt, "Guidelines for evaluating and expressing the uncertainties of NIST measurement results", NIST Techn. Note, no. 1297, 1994.
View in Google Scholar

[9] E. F. Vonesh and V. M. Chinchilli, Linear and Nonlinear Models for the Analysis of Repeated Measurements. New York, Basel, Hong Kong: Marcel Dekker, Inc. 1997.
View in Google Scholar

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Submitted

2023-04-07

Published

2002-03-30

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Section

RESEARCH ARTICLES

How to Cite

[1]
M. Schmidt-Szałowski and W. Wiatr, “A method for evaluation of uncertainties of noise parameter measurement”, JTIT, vol. 7, no. 1, pp. 34–38, Mar. 2002, doi: 10.26636/jtit.2002.1.97.

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