A method for evaluation of uncertainties of noise parameter measurement

Authors

  • Marek Schmidt-Szałowski
  • Wojciech Wiatr

DOI:

https://doi.org/10.26636/jtit.2002.1.97

Keywords:

microwaves, noise metrology, measurement system, four noise parameters, sensitivity analysis, error propagation, uncertainty

Abstract

The assessment of uncertainties of a two-port noise parameters measurement, presented in the paper, relies on modeling of sources of errors and an investigation of propagation of the errors through a measurement system. This approach is based on a simplified additive error model and small-change sensitivity analysis. The evaluated uncertainties agrees with those observed in experiments. This method may be implemented in automatic noise measurement systems for on-line uncertainty assessment and for optimization of the design of an experiment.

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Published

2002-03-30

Issue

No. 1 (2002)

Section

ARTICLES FROM THIS ISSUE

License

Copyright (c) 2002 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
M. Schmidt-Szałowski and W. Wiatr, “A method for evaluation of uncertainties of noise parameter measurement”, JTIT, vol. 7, no. 1, pp. 34–38, Mar. 2002, doi: 10.26636/jtit.2002.1.97.