Ortiz-Conde, Adelmo, Francisco J. García Sánchez, and Juin J. Liou. “On the Extraction of Threshold Voltage, Effective Channel Length and Series Resistance of MOSFETs”. Journal of Telecommunications and Information Technology 2, no. 3-4 (December 30, 2000): 43–58. Accessed January 6, 2025. https://jtit.pl/jtit/article/view/28.