EKWIŃSKA , Magdalena; RYMUZA, Zygmunt. Lateral Force Calibration Method Used for Calibration of Atomic Force Microscope. Journal of Telecommunications and Information Technology, [S. l.], v. 38, n. 4, p. 83–87, 2009. DOI: 10.26636/jtit.2009.4.985. Disponível em: https://jtit.pl/jtit/article/view/985. Acesso em: 18 apr. 2026.