RAKOWSKI, Michał; A. PLESKACZ, Witold. The influence of yield model parameters on the probability of defect occurrence. Journal of Telecommunications and Information Technology, [S. l.], v. 29, n. 3, p. 101–104, 2007. DOI: 10.26636/jtit.2007.3.840. Disponível em: https://jtit.pl/jtit/article/view/840. Acesso em: 18 apr. 2026.