RZODKIEWICZ, Witold; PANAS, Andrzej. Ellipsometric spectroscopy studies of compaction and decompaction of Si-SiO2 systems. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 29, n. 3, p. 44–48, 2007. DOI: 10.26636/jtit.2007.3.828. Disponível em: https://jtit.pl/jtit/article/view/828. Acesso em: 9 oct. 2026.