LEDERER, Dimitri; RASKIN, Jean-Pierre. On-wafer wideband characterization: a powerful tool for improving the IC technologies. Journal of Telecommunications and Information Technology, [S. l.], v. 28, n. 2, p. 69–77, 2007. DOI: 10.26636/jtit.2007.2.811. Disponível em: https://jtit.pl/jtit/article/view/811. Acesso em: 12 dec. 2024.