GOFFIOUL, Michel; VANHOENACKER, Danielle; RASKIN, Jean-Pierre. Direct extraction techniques of microwave small-signal model and technological parameters for sub-quarter micron SOI MOSFETs. Journal of Telecommunications and Information Technology, [S. l.], v. 2, n. 3-4, p. 59–66, 2000. DOI: 10.26636/jtit.2000.3-4.27. Disponível em: https://jtit.pl/jtit/article/view/27. Acesso em: 12 dec. 2024.