LEWANDOWSKI, Arkadiusz; WIATR, Wojciech. Analysis of errors in on-wafer measurements due to multimode propagation in CB-CPW. Journal of Telecommunications and Information Technology, [S. l.], v. 20, n. 2, p. 16–22, 2005. DOI: 10.26636/jtit.2005.2.313. Disponível em: https://jtit.pl/jtit/article/view/313. Acesso em: 19 apr. 2026.