GOTSZALK, Teodor Paweł; JANUS, Paweł; MARENDZIAK, Andrzej Marek; CZARNECKI, Piotr; RADOJEWSKI, Jacek Mikołaj; SZELOCH, Roman F.; GRABIEC, Piotr B.; RANGELOW, Ivo W. Diagnostics of micro- and nanostructure using the scanning probe microscopy. Journal of Telecommunications and Information Technology, [S. l.], v. 19, n. 1, p. 41–46, 2005. DOI: 10.26636/jtit.2005.1.293. Disponível em: https://jtit.pl/jtit/article/view/293. Acesso em: 1 jun. 2026.