BARAŃSK, Mateusz et al. TSSOI as an efficient tool for diagnostics of SOI technology in Institute of Electron Technology. Journal of Telecommunications and Information Technology, [S. l.], v. 19, n. 1, p. 85–93, 2005. DOI: 10.26636/jtit.2005.1.287. Disponível em: https://jtit.pl/jtit/article/view/287. Acesso em: 12 dec. 2024.