WALCZAK, Jakub; MAJKUSIAK, Bogdan. Scattering mechanisms in MOS/SOI devices with ultrathin semiconductor layers. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 15, n. 1, p. 39–49, 2004. DOI: 10.26636/jtit.2004.1.230. Disponível em: https://jtit.pl/jtit/article/view/230. Acesso em: 22 aug. 2026.