Lowering the uncertainty in fmeasurement proceduresast noise

Authors

  • Gianluca Acciari
  • Franco Giannini
  • Ernesto Limiti
  • Giovanni Saggio

DOI:

https://doi.org/10.26636/jtit.2002.1.98

Keywords:

noise, device characterisation, measurement errors, lowering uncertainty

Abstract

To completely characterise the noise behaviour of a two port device, four noise parameters Fmin, Rn, Gopt and Bopt must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 um delta-doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.

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Published

2002-03-30

Issue

No. 1 (2002)

Section

ARTICLES FROM THIS ISSUE

License

Copyright (c) 2002 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
G. Acciari, F. Giannini, E. Limiti, and G. Saggio, “Lowering the uncertainty in fmeasurement proceduresast noise”, JTIT, vol. 7, no. 1, pp. 29–33, Mar. 2002, doi: 10.26636/jtit.2002.1.98.