Lowering the uncertainty in fast noise measurement procedures

Authors

DOI:

https://doi.org/10.26636/jtit.2002.1.98

Keywords:

noise, device characterisation, measurement errors, lowering uncertainty

Abstract

To completely characterise the noise behaviour of a two port device, four noise parameters Fmin, Rn, Gopt and Bopt must be determined. This paper reports improvements in the uncertainty related to the above parameters, taking into account measurement errors due both to the limited instrument precision and connection repeatability. Results are reported for noise characterisation of 0.3 µm delta-doped HEMT devices by Alenia, demonstrating as the common hot-cold measurement procedure can result with an error confidence as low as 0.2% for all the noise parameters.

Downloads

Download data is not yet available.

References

[1] M. W. Pospieszalski, "Modeling of noise parameters of MESFET's and MODFET's and their frequency and temperature dependence", IEEE Trans. Microw. Theory Techn., vol. 37, pp. 1340-1350, 1989.
View in Google Scholar

[2] R. Q. Lane, "The determination of device noise parameters", Proc. IEEE, vol. 57, pp. 1461-1462, 1969.
View in Google Scholar

[3] G. Caruso and M. Sannino, "Computer-aided determination of microwave two-port noise parameters", IEEE Trans. Microw. Theory Techn., vol. MTT-26, no. 9, pp. 639-642, 1978.
View in Google Scholar

[4] J. M. O'Callaghan and J. P. Mondal, "A vector approach for noise parameter fitting and selection of source admittances", IEEE Trans. Microw. Theory Techn., vol. MTT-39, no. 8, pp. 1376-1381, 1991.
View in Google Scholar

[5] M. Lahdes, "Uncertainty analysis of V-band on-wafer noise parameter measurement system", in 28th Eur. Microw. Conf. Proc., Amsterdam, Netherlands, 1998, pp. 445-450.
View in Google Scholar

[6] M. Mitama and H. Katoh, "An improved computational method for noise parameter measurement", IEEE Trans. Microw. Theory Techn., vol. MTT-27, no. 6, pp. 612-615, 1979.
View in Google Scholar

[7] A. Bourdiaf and M. Laporte, "An accurate and repeatable technique for noise parameter measurements", IEEE Trans. Instrum. Measur., vol. 42, no. 2, 1993.
View in Google Scholar

Downloads

Submitted

2023-04-07

Published

2002-03-30

Issue

No. 1 (2002)

Section

RESEARCH ARTICLES

License

Copyright (c) 2002 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
G. Acciari, F. Giannini, E. Limiti, and G. Saggio, “Lowering the uncertainty in fast noise measurement procedures”, JTIT, vol. 7, no. 1, pp. 29–33, Mar. 2002, doi: 10.26636/jtit.2002.1.98.