Precise measurement of complex permittivity of materials for telecommunications devices

Authors

DOI:

https://doi.org/10.26636/jtit.2001.3.65

Keywords:

perturbation method, TLM method, cavity resonator, simulation model, temperature dependence of complex permittivity, microwave measurement

Abstract

In order to obtain precise complex permittivity of the dielectric materials obtained from the perturbation method a correction curve is made using the electromagnetic field simulator which applies transmission line modeling (TLM) method. In this experiment, generated microwave power with the frequency of 2.45 GHz is applied to heat dielectric material while measuring temperature dependence of complex permittivity of dielectric material. To obtain these objectives cavity resonator with cooling system is designed. It is found from the result that the accurate temperature dependence of complex permittivity of the materials can be obtained by the method presented here.

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References

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Submitted

2023-04-07

Published

2001-09-30

Issue

No. 3 (2001)

Section

ARTICLES FROM THIS ISSUE

License

Copyright (c) 2001 Journal of Telecommunications and Information Technology

Creative Commons License

This work is licensed under a Creative Commons Attribution 4.0 International License.

How to Cite

[1]
T. Nakamura and Y. Nikawa, “Precise measurement of complex permittivity of materials for telecommunications devices”, JTIT, vol. 5, no. 3, pp. 66–71, Sep. 2001, doi: 10.26636/jtit.2001.3.65.