Engström, Olof, Bahman Raeissi, Johan Piscator, Ivona Z. Mitrovic, Stephen Hall, Heinrich D. B. Gottlob, Mathias Szmidt, Paul K. Hurley, and Karim Cherkaoui. “Charging Phenomena at the Interface Between High-K Dielectrics and SiOx Interlayers”. Journal of Telecommunications and Information Technology 42, no. 4 (December 30, 2010): 81–90. Accessed June 17, 2026. https://jtit.pl/jtit/article/view/1115.