Piskorski, Krzysztof, and Henryk M. Przewłocki. “LPT and SLPT Measurement Methods of Flat-Band Voltage (VFB) in MOS Devices”. Journal of Telecommunications and Information Technology 38, no. 4 (December 30, 2009): 76–82. Accessed June 19, 2026. https://jtit.pl/jtit/article/view/982.