Nazarov, Alexei N., V. I. Kilchytska, Ja. N. Vovk, and J. P. Colinge. “High-Temperature Instability Processes in SOI Structures and MOSFETs”. Journal of Telecommunications and Information Technology 3, no. 1 (March 30, 2001): 18–26. Accessed April 20, 2026. https://jtit.pl/jtit/article/view/47.