Gibki , Jan, Jerzy Kątcki, Jacek Ratajczak, Lidia Łukasiak, Andrzej Jakubowski, and Daniel Tomaszewski. “Characterization of SOI Fabrication Process Using Gated-Diode Measurements and TEM Studies”. Journal of Telecommunications and Information Technology 2, no. 3-4 (December 30, 2000): 81–83. Accessed August 20, 2026. https://jtit.pl/jtit/article/view/24.