Nazarov, Alexei N., Yuri Houk, and Valeriya I. Kilchytska. “High-Field Current Transport and Charge Trapping in Buried Oxide of SOI Materials under High-Field Electron Injection”. Journal of Telecommunications and Information Technology 15, no. 1 (March 30, 2004): 50–61. Accessed April 20, 2026. https://jtit.pl/jtit/article/view/229.