M. Goffioul, D. Vanhoenacker, and J.-P. Raskin, “Direct extraction techniques of microwave small-signal model and technological parameters for sub-quarter micron SOI MOSFETs”, JTIT, vol. 2, no. 3-4, pp. 59–66, Dec. 2000, doi: 10.26636/jtit.2000.3-4.27.