Emam, Mostafa, Samer Houri, Danielle Vanhoenacker-Janvier, and Jean-Pierre Raskin. 2009. “The Impact of Externally Applied Mechanical Stress on Analog and RF Performances of SOI MOSFETs”. Journal of Telecommunications and Information Technology 38 (4): 18-24. https://doi.org/10.26636/jtit.2009.4.957.