Sedrine, Nebiha Ben, Jaouher Rihani, Jean-Christophe Harmand, and Radhouane Chtourou. 2009. “Spectroscopic Ellipsometry Analysis of Rapid Thermal Annealing Effect on MBE Grown GaAs1−x−Nx”. Journal of Telecommunications and Information Technology 35 (1): 51-56. https://doi.org/10.26636/jtit.2009.1.914.