Zaunert, Florian, Ralf Endres, Yordan Stefanov, and Udo Schwalke. 2007. “Evaluation of MOSFETs With Crystalline High-K Gate-Dielectrics: Device Simulation and Experimental Data”. Journal of Telecommunications and Information Technology 28 (2): 78-85. https://doi.org/10.26636/jtit.2007.2.812.