Katcki, Jerzy, Jacek Ratajczak, Andrzej Jakubowski, Lidia Łukasiak, Daniel Tomaszewski, and Jan Gibki. 2000. “Characterization of SOI Fabrication Process Using Gated-Diode Measurements and TEM Studies”. Journal of Telecommunications and Information Technology 2 (3-4): 81-83. https://doi.org/10.26636/jtit.2000.3-4.24.