SEDRINE, Nebiha Ben; RIHANI, Jaouher; HARMAND, Jean-Christophe; CHTOUROU, Radhouane. Spectroscopic Ellipsometry Analysis of Rapid Thermal Annealing Effect on MBE Grown GaAs1−x−Nx. Journal of Telecommunications and Information Technology, [S. l.], v. 35, n. 1, p. 51–56, 2009. DOI: 10.26636/jtit.2009.1.914. Disponível em: https://jtit.pl/jtit/article/view/914. Acesso em: 22 apr. 2026.