DĘBSKI, Tomasz; BARTH, Wolfgang; RANGELOW, Ivo W.; DOMAŃSKI, Krzysztof; TOMASZEWSKI, Daniel; GRABIEC, Piotr; JAKUBOWSKI, Andrzej. Piezoresistive sensors for atomic force microscopy. Journal of Telecommunications and Information Technology, [S. l.], v. 3, n. 1, p. 35–39, 2001. DOI: 10.26636/jtit.2001.1.45. Disponível em: https://jtit.pl/jtit/article/view/45. Acesso em: 12 dec. 2024.