GOFFIOUL, Michael; DAMBRINE, Gilles; VANHOENACKER, Danielle; RASKIN, Jean-Pierre. Comparison of microwave performances for sub-quarter micron fully- and partially-depleted SOI MOSFETs. Journal of Telecommunications and Information Technology, [S. l.], v. 2, n. 3-4, p. 72–80, 2000. DOI: 10.26636/jtit.2000.3-4.25. Disponível em: https://jtit.pl/jtit/article/view/25. Acesso em: 12 dec. 2024.