KATCKI, Jerzy; RATAJCZAK, Jacek; JAKUBOWSKI, Andrzej; ŁUKASIAK, Lidia; TOMASZEWSKI, Daniel; GIBKI , Jan. Characterization of SOI fabrication process using gated-diode measurements and TEM studies. Journal of Telecommunications and Information Technology, [S. l.], v. 2, n. 3-4, p. 81–83, 2000. DOI: 10.26636/jtit.2000.3-4.24. Disponível em: https://jtit.pl/jtit/article/view/24. Acesso em: 22 apr. 2026.