GIBKI , Jan; KĄTCKI, Jerzy; RATAJCZAK, Jacek; ŁUKASIAK, Lidia; JAKUBOWSKI, Andrzej; TOMASZEWSKI, Daniel. Characterization of SOI fabrication process using gated-diode measurements and TEM studies. Journal of Telecommunications and Information Technology, Warsaw, Poland, v. 2, n. 3-4, p. 81–83, 2000. DOI: 10.26636/jtit.2000.3-4.24. Disponível em: https://jtit.pl/jtit/article/view/24. Acesso em: 20 aug. 2026.