JOMAAH, Jalal; BALESTRA, Francis; GHIBAUDO, Gérard. Low frequency noise in advanced Si bulk and SOI MOSFETs. Journal of Telecommunications and Information Technology, [S. l.], v. 19, n. 1, p. 24–33, 2005. DOI: 10.26636/jtit.2005.1.295. Disponível em: https://jtit.pl/jtit/article/view/295. Acesso em: 12 dec. 2024.