SIKORA, Andrzej; SANKOWSKA, Anna; GOTSZALK, Teodor Paweł. Application of scanning shear-force microscope for fabrication of nanostructures. Journal of Telecommunications and Information Technology, [S. l.], v. 19, n. 1, p. 81–84, 2005. DOI: 10.26636/jtit.2005.1.288. Disponível em: https://jtit.pl/jtit/article/view/288. Acesso em: 12 dec. 2024.