BOROWICZ, Lech Kazimierz. Photoelectric measurements of the local values of the effective contact potential difference in the MOS structure. Journal of Telecommunications and Information Technology, [S. l.], v. 19, n. 1, p. 112–114, 2005. DOI: 10.26636/jtit.2005.1.283. Disponível em: https://jtit.pl/jtit/article/view/283. Acesso em: 12 dec. 2024.