Engström, O., Raeissi, B., Piscator, J., Mitrovic, I. Z., Hall, S., Gottlob, H. D. B., Szmidt, M., Hurley, P. K., & Cherkaoui, K. (2010). Charging Phenomena at the Interface Between High-k Dielectrics and SiOx Interlayers. Journal of Telecommunications and Information Technology, 42(4), 81-90. https://doi.org/10.26636/jtit.2010.4.1115