Emam, M., Houri, S., Vanhoenacker-Janvier, D., & Raskin, J.-P. (2009). The Impact of Externally Applied Mechanical Stress on Analog and RF Performances of SOI MOSFETs. Journal of Telecommunications and Information Technology, 38(4), 18-24. https://doi.org/10.26636/jtit.2009.4.957