Goffioul, M., Dambrine, G., Vanhoenacker, D., & Raskin, J.-P. (2000). Comparison of microwave performances for sub-quarter micron fully- and partially-depleted SOI MOSFETs. Journal of Telecommunications and Information Technology, 2(3-4), 72-80. https://doi.org/10.26636/jtit.2000.3-4.25