Sedrine, N.B. et al. 2009. Spectroscopic Ellipsometry Analysis of Rapid Thermal Annealing Effect on MBE Grown GaAs1−x−Nx. Journal of Telecommunications and Information Technology. 35, 1 (Mar. 2009), 51–56. DOI:https://doi.org/10.26636/jtit.2009.1.914.